ISBN:
9781904982654
,
1904982654
Language:
English
Pages:
XI, 212 S.
,
Ill., graph. Darst.
,
30 cm
Additional Information:
Rezension Cartwright, Caroline SEM and microanalysis in the study of historical technology, materials and conservation, edited by Nigel Meeks ... - [Rezension] 2012
DDC:
502.825
Keywords:
Scanning electron microscopy.
;
X-ray microanalysis.
;
Scanning electron microscopy
;
X-ray microanalysis
;
Konferenzschrift 2010
;
Rasterelektronenmikroskop
Note:
Presentations given at a two-day meeting held at the British Museum on 9-10 September 2010
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